Investigation of substrate resistance and inductance on deep trench capacitor for RF application

Vikash Kumar, A. Aminulloh, Shao-Ming Yang, G. Sheu
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Abstract

A circuit analysis is introduced to detect the value of the substrate resistance and the capacitance, which is mainly caused by p-n junction diode. The effect of the substrate resistance on RF application is reported in this paper. When trench number increases the substrate resistance decreases. Effect of the inductance on the capacitor is also investigated. The inductance should be low value in the high frequency range to minimize inductance effect for Radio Frequency (RF) application. A two-port admittance parameter is used to extract the value of capacitance, inductance and substrate resistance.
射频用深沟电容器基板电阻和电感的研究
介绍了一种检测衬底电阻值和电容值的电路分析方法,主要是由pn结二极管引起的。本文报道了衬底电阻对射频应用的影响。当沟槽数增加时,衬底电阻减小。研究了电感对电容的影响。在射频(RF)应用中,为使电感效应最小化,在高频范围内电感值应尽量小。采用双端口导纳参数提取电容、电感和衬底电阻的值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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