Noise effects in RTD-fluxgate

Abstract

Models and an extensive set of theoretical findings of residence times difference (RTD) fluxgate have been already presented in previous papers. A very simple sensor structure, negligible onboard power requirements and the intrinsic digital form of the readout signal are the main features of the proposed strategy. In this paper we aim to investigate main sources of uncertainty, including noise, and possible strategies to limit their effects on the devices; finally results on noise characterization are presented