Method of dynamically determining cycle time of a working stage

Tza-Huei Wang, Kuo-Cheng Lin, Seng-Rong Huang
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引用次数: 2

Abstract

This paper presents a method of predicting production cycle time of a working stage in semiconductor manufacturing. For Scheduling, cycle time of a stage is usually applied to estimate the cycle time of the entire production line or the remaining production time. It is also often applied to generate the reasonable inventory level that should be queued in front of a stage. Since cycle time is highly affected by equipment loading density, a model is first created by combining Little's formula and Kingman's equation in the queuing theory to relate loading density with it. Cycle time distribution of each stage over the past time is characterized as a parameter set, based on the cycle time model and using a plurality of prior associated data. The equipment loading density of a stage in the next production run is calculated by considering the demanded quantity, mix and process flows of products. The stage cycle time of the next production run is then predicted by applying the equipment loading density to the cycle time model. The optimum amount of inventory kept in front of a stage to prevent equipment staving or WIP (work in process) piling up is also determined by using the data of cycle time and production target of a stage. The cycle time and the optimum inventory level (which is called standard WIP) of a stage are dynamically tuned as the customers' demands vary. With this, cycle time and standard WIP could be more precisely defined and the delivery would be well controlled.
动态确定工作阶段周期时间的方法
本文提出了一种预测半导体制造工作阶段生产周期时间的方法。在调度中,通常使用一个阶段的周期时间来估计整个生产线的周期时间或剩余的生产时间。它还经常用于生成应该在舞台前排队的合理库存水平。由于循环时间受设备装载密度的影响较大,因此首先结合排队论中的Little公式和Kingman方程建立了装载密度与其关联的模型。每个阶段在过去时间上的周期时间分布被表征为一个参数集,该参数集基于周期时间模型并使用多个先验相关数据。通过考虑产品的需求量、混合和工艺流程,计算出下一个生产运行阶段的设备负荷密度。然后通过将设备负荷密度应用于周期时间模型来预测下一次生产运行的阶段周期时间。利用生产周期时间和生产目标数据,确定生产阶段前的最佳库存数量,以防止设备滞留或在制品堆积。一个阶段的周期时间和最优库存水平(称为标准WIP)会随着客户需求的变化而动态调整。这样,可以更精确地定义周期时间和标准在制品,并且可以很好地控制交货。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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