A fully-digital EM pulse detector

David El-Baze, J. Rigaud, P. Maurine
{"title":"A fully-digital EM pulse detector","authors":"David El-Baze, J. Rigaud, P. Maurine","doi":"10.3850/9783981537079_0164","DOIUrl":null,"url":null,"abstract":"ElectroMagnetic Pulse Injection (EMPI) has recently been demonstrated to be an efficient fault injection technique with many advantages especially when considering security issues of Systems on Chip (SoC) embedded on ball grid array packages, i.e. when adversaries do not have an easy access to the backside. EMPI must therefore be considered as a real threat against smartcards and SoC from now on. Among the usual countermeasures against fault attacks, one can identify the use of embedded sensors. If one can find voltage glitch or laser shot detectors in the literature, there is only one proposal which puts forward the idea of detecting ElectroMagnetic Pulse (EMP). However, this former sensor requires a fine tuning of some timing characteristics and, as a result, its use appears complex and even impractical within a SoC which are heterogeneous by nature and designed by worldwide teams. Within this context, this paper introduces and experimentally validates a new sensor allowing to detect EMP. Because the sensor is fully digital, it is low cost and above all fully compliant with the standard design flow of SoC.","PeriodicalId":311352,"journal":{"name":"2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3850/9783981537079_0164","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

Abstract

ElectroMagnetic Pulse Injection (EMPI) has recently been demonstrated to be an efficient fault injection technique with many advantages especially when considering security issues of Systems on Chip (SoC) embedded on ball grid array packages, i.e. when adversaries do not have an easy access to the backside. EMPI must therefore be considered as a real threat against smartcards and SoC from now on. Among the usual countermeasures against fault attacks, one can identify the use of embedded sensors. If one can find voltage glitch or laser shot detectors in the literature, there is only one proposal which puts forward the idea of detecting ElectroMagnetic Pulse (EMP). However, this former sensor requires a fine tuning of some timing characteristics and, as a result, its use appears complex and even impractical within a SoC which are heterogeneous by nature and designed by worldwide teams. Within this context, this paper introduces and experimentally validates a new sensor allowing to detect EMP. Because the sensor is fully digital, it is low cost and above all fully compliant with the standard design flow of SoC.
全数字电磁脉冲探测器
电磁脉冲注入(EMPI)最近被证明是一种有效的故障注入技术,具有许多优点,特别是当考虑到嵌入在球栅阵列封装上的片上系统(SoC)的安全问题时,即当攻击者无法轻松访问背面时。因此,从现在开始,EMPI必须被视为对智能卡和SoC的真正威胁。在针对故障攻击的常用对策中,可以识别嵌入式传感器的使用。如果能在文献中找到电压故障或激光射击探测器,只有一个方案提出了检测电磁脉冲(EMP)的想法。然而,这种前传感器需要对一些时序特性进行微调,因此,它的使用在本质上是异构的、由全球团队设计的SoC中显得复杂甚至不切实际。在此背景下,本文介绍并实验验证了一种允许检测EMP的新型传感器。由于该传感器是全数字化的,因此成本低,最重要的是完全符合SoC的标准设计流程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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