Exact evaluation of diagnostic test resolution

Abstract

The authors introduce a new measure of the diagnostic resolution of a test set: the sizes of all equivalence classes in the circuit under the test set. This measure is a better indicator of the diagnostic capabilities of a test set than single-value metrics based on undistinguished pairs of faults or completely distinguished faults. A symbolic algorithm for computing equivalence class sizes has been used to evaluate the diagnostic resolution of deterministic single-stuck-at fault test sets for ISCAS combinational and sequential benchmark circuits.<>