Exploiting Parasitics to Design a Flip-chip Integrated Transformer Based Matching Network

Pankaj Venuturupalli, S. Mahani, Sondón Santiago Martin, F. Kuttner, J. Sturm
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Abstract

This paper presents a design procedure that involves incorporating the parasitics into the design of a transformer based Matching Network(MN). In this work, flip-chip based integration is opted to connect the on-chip blocks to the external circuitry. At mm-Wave range, parasitics from the bump, ESD and metal traces play a vital role in altering the desired performance of MN. The inductance and capacitance contributed by the ESD structure and the flip-chip bump are extracted from EM simulations which are embedded into the design. This optimization process requires multiple trails which is addressed by SKILL code based spiral inductor layout generation. The MN designed in 28nm CMOS converts a 50Ω load to 4 + 5.1j for a mm-Wave DAC functioning at 28GHz.
利用寄生效应设计一个基于倒装集成变压器的匹配网络
本文提出了一种将寄生效应纳入变压器匹配网络设计的设计方法。在这项工作中,选择基于倒装芯片的集成来连接片上模块到外部电路。在毫米波范围内,来自碰撞、ESD和金属走线的寄生对改变MN的预期性能起着至关重要的作用。从嵌入到设计中的电磁仿真中提取由ESD结构和倒装芯片碰撞产生的电感和电容。这个优化过程需要多个路径,这是由SKILL代码基于螺旋电感布局生成解决。采用28nm CMOS设计的MN将50Ω负载转换为4 + 5.1j,用于28GHz工作的毫米波DAC。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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