Antenna pattern measurement using a planar linear scanner

Abstract

This work propose a novel antenna measurement range configuration that is applicable to millimeter wave band antennas. The antenna pattern measurement process includes sampling the radiated fields from the antenna-under-test with a 2D planar scanner and processing the data with algorithms for position translation and field calibration. Feasibility of the proposed approach is examined via X-band measurements in a planar near field range. Processed patterns show good agreement with the ones derived from conventional far-field range. This relatively simple range configuration can be adopted in the millimeter wave band for precise measurements.