Root Cause Analysis on Analog Circuit Using TR-LADA

Abstract

Analog circuits are traditionally harder to debug using light assisted device alteration (LADA) also known as dynamic laser stimulation (DLS), as the circuitry are too sensitive to carrier generations. This paper showcases a successful post-silicon debug on analog circuitries (start-up circuit) using nanosecond pulse-on-demand laser to perform DLS leading into root cause identification on a marginality issue in a sub-20nm FinFET technology device.