{"title":"High Strain Rate Properties and Evolution of Plastic-Work for Doped Solder SAC-Q for Isothermal Aging Up to 240-Days at 100°C","authors":"P. Lall, V. Mehta, J. Suhling, K. Blecker","doi":"10.1115/ipack2022-97438","DOIUrl":null,"url":null,"abstract":"\n In automotive, aerospace, and defense applications – electronic parts can often be exposed to high strain loads during shocks, vibrations and drop-impact conditions. Electronic parts can often face extreme low and high temperatures ranging from −65°C to 200°C. Additionally, these electronic devices can be subjected to strain rates of 1 to 100 per second in a critical environment. Numerous doped solder alloys have emerged to mitigate the effects of sustained high-temperature operation. The mechanical properties of SAC-Q solder alloy, isothermally aged for prolonged durations and tested at extremely low to high operating temperatures, are not available. In this work, SAC-Q doped solder material is tested and studied for this study at a range of operating temperatures of −65°C to 200°C and at a strain rate up to 75 per second for up to 240 days (i.e. 8 months) of isothermal aging with a storage temperature of 100°C. For the extensive range of strain rates and surrounding test temperatures, stress-strain curves are established for the solder. The measured experimental results and data were fitted to the Anand viscoplasticity model. The Anand constants were calculated by estimating the stress-strain behavior measured for operating temperatures −65°C to 200°C for SAC-Q solder. FE analysis for drop/shock events for BGA package assembly with PCB has been carried out. Hysteresis stress-strain curves and plastic work density curves are generated for various aging conditions for SAC-Q solder ball joints.","PeriodicalId":117260,"journal":{"name":"ASME 2022 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASME 2022 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1115/ipack2022-97438","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In automotive, aerospace, and defense applications – electronic parts can often be exposed to high strain loads during shocks, vibrations and drop-impact conditions. Electronic parts can often face extreme low and high temperatures ranging from −65°C to 200°C. Additionally, these electronic devices can be subjected to strain rates of 1 to 100 per second in a critical environment. Numerous doped solder alloys have emerged to mitigate the effects of sustained high-temperature operation. The mechanical properties of SAC-Q solder alloy, isothermally aged for prolonged durations and tested at extremely low to high operating temperatures, are not available. In this work, SAC-Q doped solder material is tested and studied for this study at a range of operating temperatures of −65°C to 200°C and at a strain rate up to 75 per second for up to 240 days (i.e. 8 months) of isothermal aging with a storage temperature of 100°C. For the extensive range of strain rates and surrounding test temperatures, stress-strain curves are established for the solder. The measured experimental results and data were fitted to the Anand viscoplasticity model. The Anand constants were calculated by estimating the stress-strain behavior measured for operating temperatures −65°C to 200°C for SAC-Q solder. FE analysis for drop/shock events for BGA package assembly with PCB has been carried out. Hysteresis stress-strain curves and plastic work density curves are generated for various aging conditions for SAC-Q solder ball joints.