Are Argon and Nitrogen Gases Really Inert to Graphene Devices?

J. Kumar, M. Shrivastava
{"title":"Are Argon and Nitrogen Gases Really Inert to Graphene Devices?","authors":"J. Kumar, M. Shrivastava","doi":"10.1109/DRC55272.2022.9855822","DOIUrl":null,"url":null,"abstract":"Argon and Nitrogen in their gaseous state are used to provide an inert environment either during probing electronic materials and devices or processing such devices. Although these gases are relatively inert with bulk materials, the gases, however, can interact with different surfaces and influence device physics and surface chemistry. Graphene, a monolayer 2D material, can be influenced by these gases, especially in carbon vacancy and Stone Wales (SW) point defects, which are inherently present in graphene due to growth or synthesis challenges. In this work, we have explored the interaction of graphene with argon and nitrogen in the presence of carbon vacancy and SW point defects based on Density Functional Theory (DFT) and Non-Equilibrium Greens Function (NEGF) computational methods using the QuantumATK simulation tool. We have investigated that, although nitrogen and argon are inert to pristine graphene, the gases enhance their orbitals overlap with graphene in the presence of these defects. Fundamental properties of graphene which drive corresponding device behavior, like band structure, trap states, and fermi energy level, are perturbed by this enhanced interaction. NEGF study reveals that channel current in graphene devices can be degraded due to the influence of these gases in the presence of carbon vacancy and SW defects.","PeriodicalId":200504,"journal":{"name":"2022 Device Research Conference (DRC)","volume":"429 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Device Research Conference (DRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC55272.2022.9855822","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Argon and Nitrogen in their gaseous state are used to provide an inert environment either during probing electronic materials and devices or processing such devices. Although these gases are relatively inert with bulk materials, the gases, however, can interact with different surfaces and influence device physics and surface chemistry. Graphene, a monolayer 2D material, can be influenced by these gases, especially in carbon vacancy and Stone Wales (SW) point defects, which are inherently present in graphene due to growth or synthesis challenges. In this work, we have explored the interaction of graphene with argon and nitrogen in the presence of carbon vacancy and SW point defects based on Density Functional Theory (DFT) and Non-Equilibrium Greens Function (NEGF) computational methods using the QuantumATK simulation tool. We have investigated that, although nitrogen and argon are inert to pristine graphene, the gases enhance their orbitals overlap with graphene in the presence of these defects. Fundamental properties of graphene which drive corresponding device behavior, like band structure, trap states, and fermi energy level, are perturbed by this enhanced interaction. NEGF study reveals that channel current in graphene devices can be degraded due to the influence of these gases in the presence of carbon vacancy and SW defects.
氩气和氮气对石墨烯器件真的是惰性的吗?
在探测电子材料和设备或加工此类设备期间,气态的氩气和氮气用于提供惰性环境。尽管这些气体与大块材料相对惰性,但是,这些气体可以与不同的表面相互作用,并影响器件的物理和表面化学。石墨烯是一种单层二维材料,可能会受到这些气体的影响,特别是在碳空位和石威尔士(SW)点缺陷中,这是石墨烯由于生长或合成挑战而固有存在的。在这项工作中,我们利用QuantumATK模拟工具,基于密度泛函理论(DFT)和非平衡格林函数(NEGF)计算方法,探索了石墨烯与氩和氮在碳空位和SW点缺陷存在下的相互作用。我们已经研究过,尽管氮气和氩气对原始石墨烯是惰性的,但在存在这些缺陷的情况下,这些气体增强了它们与石墨烯的轨道重叠。驱动相应器件行为的石墨烯的基本性质,如能带结构、陷阱态和费米能级,受到这种增强的相互作用的干扰。NEGF研究表明,在存在碳空位和SW缺陷的情况下,石墨烯器件中的通道电流会受到这些气体的影响而降低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信