Fault detection for mixed signal ICs by current integration

Abstract

A fault detection method for mixed signal integrated circuits by the current integral is proposed. Monitoring the integral of the supply current is specially used for real time, batch testing for mixed signal integrated circuits because additional computation and comparing the obtained current waveforms with the free fault current do not required. Two bit parallel comparison CMOS AD converter is adopted as the circuit under test. The integral of the supply current is only monitored during one clock period when the input stimulus is applied, determining whether the circuit is free fault.