{"title":"Neyman-Pearson test for DC restoration error correction","authors":"Seungjoon Yang, Youngho Lee, Pilho Yu","doi":"10.1109/ICCE.2003.1218914","DOIUrl":null,"url":null,"abstract":"This paper presents a novel DC restoration error correction method based on the statistical hypothesis testing. The proposed method can remove the line-wise error in analog images introduced during the DC restoration processes.","PeriodicalId":319221,"journal":{"name":"2003 IEEE International Conference on Consumer Electronics, 2003. ICCE.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Conference on Consumer Electronics, 2003. ICCE.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCE.2003.1218914","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents a novel DC restoration error correction method based on the statistical hypothesis testing. The proposed method can remove the line-wise error in analog images introduced during the DC restoration processes.