Rapid SOC prototyping utilizing quilt packaging technology for modular functional IC partitioning

Tian Lu, Carlos Ortega, J. Kulick, G. Bernstein, Scott Ardisson, Rob Engelhardt
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引用次数: 2

Abstract

A microchip integration technology called Quilt Packaging (QP) enables rapid prototyping of complex SoCs and microwave/RF systems, as well as optical, power, and DSP applications. QP is a direct edge-to-edge chip-level interconnect technology that can be implemented in a variety of materials and/or process technologies, and has been demonstrated in both planar and non-planar 3D architectures. Quilt Packaging technology can be applied to create a “Lego-like” design kit for ultra-fast prototyping and proof-ofconcept chip-level system verification. Partitioning subcomponents into small, inexpensive “chiplets” can allow for much faster design turns and greatly reduced first-pass prototype verification. In addition, QP enables low-loss, high-throughput chip-to-chip I/O interconnects while reducing size, weight, and power requirements, lessening the burden of design trade-offs for hardware system designers developing the next generation of microelectronic systems.
快速SOC原型利用被子封装技术的模块化功能IC划分
一种称为被子封装(QP)的微芯片集成技术使复杂的soc和微波/RF系统以及光学,电源和DSP应用的快速原型设计成为可能。QP是一种直接的边缘到边缘芯片级互连技术,可以在各种材料和/或工艺技术中实现,并已在平面和非平面3D架构中得到验证。被子封装技术可用于创建“乐高”设计套件,用于超快速原型设计和概念验证芯片级系统验证。将子组件划分成小的、廉价的“小芯片”可以允许更快的设计回合,并大大减少第一次原型验证。此外,QP实现了低损耗、高吞吐量的片对片I/O互连,同时减小了尺寸、重量和功耗要求,减轻了硬件系统设计人员开发下一代微电子系统的设计权衡负担。
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