A method of test generation for fault location in combinational logic

Abstract

The Path Generating Method is a simple procedure to obtain, from a directed graph, an irredundant set of paths that is sufficient to detect and isolate all distinguishable failures. It was developed as a tool for diagnostic generation at the system level, e.g., to test data paths and register loading and to test a sequence of transfer instructions. But it has been found to be a powerful tool for test generation for combinational logic networks as well.