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The 50-Million Transistor Chip: The Quality Challenge for 2001

IEEE International Symposium on Quality Electronic Design Pub Date : 1900-01-01 DOI:10.1109/ISQED.2001.10008
R. Merritt, R. Goering
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5000万晶体管芯片:2001年的质量挑战
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IEEE International Symposium on Quality Electronic Design
IEEE International Symposium on Quality Electronic Design
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