Direct solution of the Boltzmann transport equation in nanoscale Si devices

K. Banoo, M. Lundstrom, R.K. Smith
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引用次数: 30

Abstract

We report the first direct numerical solution to the Boltzmann transport equation (BTE) without making any approximations about the angular shape of the distribution function or the collision integral. The mathematical and numerical techniques used for solving this problem are discussed and shown to have the correct properties for semiconductor simulation. The applications of this method are general and are demonstrated here, for both one-dimensional (50 nm n/sup +/-p-n/sup +/) and two-dimensional (50 nm ultra-thin body dual-gate nMOSFET) devices.
纳米硅器件中玻尔兹曼输运方程的直接解
我们报告了玻尔兹曼输运方程(BTE)的第一个直接数值解,而没有对分布函数的角形状或碰撞积分进行任何近似。讨论了用于解决这一问题的数学和数值技术,并证明它们具有用于半导体模拟的正确性质。该方法在一维(50 nm n/sup +/-p-n/sup +/)和二维(50 nm超薄体双栅nMOSFET)器件中的应用是普遍的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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