A 107 dB SFDR, 80 kS/s Nyquist-rate SAR ADC using a hybrid capacitive and incremental ΣΔ DAC

Ahmad AlMarashli, J. Anders, J. Becker, M. Ortmanns
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引用次数: 7

Abstract

This paper introduces an architecture and design for high resolution, high linearity Nyquist rate SAR ADCs requiring only a single simple calibration at startup. The proposed architecture benefits from an intrinsically linear 1.5 bit ΣΔ DAC to resolve the fine bits of the SAR ADC after a coarse conversion phase with a monotonically switched capacitive DAC. The ΣΔ DAC is also used for a single shot calibration of the coarse CDAC which therefore does not require good matching and can be sized solely upon noise requirements. A prototype was fabricated in 40 nm CMOS, with power supplies of 1.1 V and 2.5 V. It occupies an active area of only 0.074mm2. The prototype achieves a measured peak SFDR of 107 dB and a noise limited SNDR of 84.8 dB at 80 kS/s Nyquist rate operation. The core power consumption is 101 μW at 80 kS/s. In oversampling mode, the ADC achieves an SNDR above 90 dB over a 5 kHz bandwidth.
一个107 dB SFDR, 80 kS/s奈奎斯特速率SAR ADC,采用混合电容式和增量式ΣΔ DAC
本文介绍了一种高分辨率、高线性奈奎斯特速率SAR adc的结构和设计,只需在启动时进行一次简单的校准。所提出的架构得益于一个本质线性的1.5位ΣΔ DAC,该DAC在使用单调开关电容DAC进行粗转换阶段后解析SAR ADC的精细位。ΣΔ DAC也用于粗CDAC的单次校准,因此不需要良好的匹配,可以根据噪声要求单独调整大小。在40 nm CMOS上制作了原型,电源分别为1.1 V和2.5 V。它占据的活动面积只有0.074平方毫米。该样机在80 k /s奈奎斯特速率下的实测峰值SFDR为107 dB,噪声限制SNDR为84.8 dB。80k /s时核心功耗为101 μW。在过采样模式下,ADC在5 kHz带宽上实现90 dB以上的SNDR。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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