{"title":"Proposal of device capability profiling for manufacturing application service interface","authors":"Kenji Suzuki, T. Ideguchi","doi":"10.1109/ICIT.2009.4939689","DOIUrl":null,"url":null,"abstract":"Recently, generic application service interface specifications (GDI, FDT, OPC-UA, etc.) were standardized for the system integration of different field bus technologies. However, since each field bus technology had an original device description, it was not able to describe the device capability profile of the device in a unified way. In this paper, the device capability profiling method corresponding to multi-technology is proposed for GDI which is one of generic application service interfaces. The device capability profile of each device is previously described in the XML schema definition language (XSD) according to the template. It is shown that the parameter instance which describes the values of devices can be described by an XML document, using the device capability profile as a schema. And it is shown that the manufacturing application service interface which accesses manufacturing equipment can be realized on GDI by using OASIS Production Planning and Scheduling (PPS) protocol. For standardization of a manufacturing application service interface, we proposed adding this method to ISO 20242 standard to ISO.","PeriodicalId":405687,"journal":{"name":"2009 IEEE International Conference on Industrial Technology","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-02-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE International Conference on Industrial Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIT.2009.4939689","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Recently, generic application service interface specifications (GDI, FDT, OPC-UA, etc.) were standardized for the system integration of different field bus technologies. However, since each field bus technology had an original device description, it was not able to describe the device capability profile of the device in a unified way. In this paper, the device capability profiling method corresponding to multi-technology is proposed for GDI which is one of generic application service interfaces. The device capability profile of each device is previously described in the XML schema definition language (XSD) according to the template. It is shown that the parameter instance which describes the values of devices can be described by an XML document, using the device capability profile as a schema. And it is shown that the manufacturing application service interface which accesses manufacturing equipment can be realized on GDI by using OASIS Production Planning and Scheduling (PPS) protocol. For standardization of a manufacturing application service interface, we proposed adding this method to ISO 20242 standard to ISO.