Reducing lead-free soldering failures caused by Printed Circuit Board shrinkage

A. Géczy, L. Tersztyanszky, B. Illés, A. Kemler, A. Szabó
{"title":"Reducing lead-free soldering failures caused by Printed Circuit Board shrinkage","authors":"A. Géczy, L. Tersztyanszky, B. Illés, A. Kemler, A. Szabó","doi":"10.1109/SIITME.2013.6743645","DOIUrl":null,"url":null,"abstract":"The paper presents a novel approach on an emerging problem in lead-free reflow soldering technology. The trend of miniaturized SMD device application and the increasing component density cause newfound problems during the reflow process. In this work, the issue of Printed Circuit Board (PCB) shrinkage is inspected in the environment of automotive electronics production. The shrinkage effect results in linear offset on the double sided PCB along the (XY) dimensions during stencil printing of the second reflow pass. The observed phenomenon causes tombstone and bridging failures on specific fine-pitch SMD components. To investigate and obtain deeper understanding of the phenomenon, a new method was developed for the measurement of shrinkage. The novel measurement method is evaluated with a less-productive, but more precise measurement device. With the collected data it is possible to approximate the overall shrinkage of the given product. After introducing a compensation step on the stencil design (based on the measurements), it is possible to significantly reduce the quantity of failures caused by the shrinkage.","PeriodicalId":267846,"journal":{"name":"2013 IEEE 19th International Symposium for Design and Technology in Electronic Packaging (SIITME)","volume":"34 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 19th International Symposium for Design and Technology in Electronic Packaging (SIITME)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIITME.2013.6743645","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

The paper presents a novel approach on an emerging problem in lead-free reflow soldering technology. The trend of miniaturized SMD device application and the increasing component density cause newfound problems during the reflow process. In this work, the issue of Printed Circuit Board (PCB) shrinkage is inspected in the environment of automotive electronics production. The shrinkage effect results in linear offset on the double sided PCB along the (XY) dimensions during stencil printing of the second reflow pass. The observed phenomenon causes tombstone and bridging failures on specific fine-pitch SMD components. To investigate and obtain deeper understanding of the phenomenon, a new method was developed for the measurement of shrinkage. The novel measurement method is evaluated with a less-productive, but more precise measurement device. With the collected data it is possible to approximate the overall shrinkage of the given product. After introducing a compensation step on the stencil design (based on the measurements), it is possible to significantly reduce the quantity of failures caused by the shrinkage.
减少印刷电路板收缩造成的无铅焊接故障
本文针对无铅回流焊技术中的一个新问题,提出了一种新颖的方法。SMD器件小型化的趋势和元件密度的不断提高,导致回流过程中出现了新的问题。本文对汽车电子产品生产环境中印刷电路板(PCB)的收缩问题进行了研究。收缩效应导致双面PCB沿(XY)尺寸在第二次回流通道的模板印刷过程中的线性偏移。所观察到的现象会导致特定细间距SMD组件的墓碑故障和桥接故障。为了研究和更深入地了解这一现象,开发了一种测量收缩的新方法。用一种生产率较低但精度较高的测量装置对这种新型测量方法进行了评价。有了收集到的数据,就有可能近似地计算出给定产品的总体收缩。在模板设计上引入补偿步骤(基于测量)后,可以显着减少由收缩引起的故障数量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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