{"title":"Simple Formulae for the Effective Plus-Factor for Transient Enhanced Diffusion","authors":"G. Hobler, V. Moroz","doi":"10.1109/ESSDERC.2000.194741","DOIUrl":null,"url":null,"abstract":"Simple analytical expressions for the effective plus-factor for transient enhanced diffusion after non-amorphizing implantations in silicon are presented. The formulae describe the ion mass, implant energy, and dose dependence of the numerically calculated plus-factor with a root mean square error of 3%. The accuracy of the numerical data as well as possible errors from a depth dependence of the plus-factor are dis-","PeriodicalId":354721,"journal":{"name":"30th European Solid-State Device Research Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"30th European Solid-State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2000.194741","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Simple analytical expressions for the effective plus-factor for transient enhanced diffusion after non-amorphizing implantations in silicon are presented. The formulae describe the ion mass, implant energy, and dose dependence of the numerically calculated plus-factor with a root mean square error of 3%. The accuracy of the numerical data as well as possible errors from a depth dependence of the plus-factor are dis-