Fuzzy-based circuit partitioning in built-in current testing

Abstract

Partitioning a digital circuit into modules before implementing it on a single chip is key to balancing between the test cost and test correctness of built-in current testing (BICT). Most partitioning methods use statistical analysis to find the threshold value and then to determine the size of a module. These methods are rigid and inflexible, since IDDQ testing requires the measurement of an analog quantity rather than a digital signal. In this paper, we propose a fuzzy-based approach which provides a soft threshold to determine the module size for BICT partitioning. Evaluation results show that our design approach indeed provides a feasible way to exploit the design space of BICT partitioning.