Performance modeling of intercalation doped graphene-nanoribbon interconnects

Subhajit Das, Debaprasad Das, H. Rahaman
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引用次数: 2

Abstract

In this work, we have presented the temperature dependent equivalent single conductor (ESC) model and performance analysis of undoped and doped multilayer graphene nanoribbon (MLGNR) interconnects. The common resistive model of both top-contact and side-contact multilayer GNR interconnects has been demonstrated using multi-conductor based methodology. The propagation delay of pristine (undoped), Arsenic pentafluoride (AsF5), Ferric chloride (FeCl3) and Lithium (Li) intercalation doped MLGNR interconnect is investigated for different temperature and different interconnect length at 16nm technology node. The results show a considerable rise of delay of MLGNR interconnects with the rise of temperature. It is found that AsF5-, FeCl3- and Li-intercalated top-contact MLGNR interconnects show superior resistive performance than that of its pristine counterpart at higher temperature. Li-intercalated TC-MLGNR has been found to be the fastest among all types of MLGNR interconnects as well as conventional Cu over the temperature range from 150K to 450K.
嵌入掺杂石墨烯-纳米带互连的性能建模
在这项工作中,我们提出了温度相关的等效单导体(ESC)模型和未掺杂和掺杂多层石墨烯纳米带(MLGNR)互连的性能分析。采用基于多导体的方法,对顶接触和侧接触多层GNR互连的共同电阻模型进行了论证。研究了原始(未掺杂)、五氟化砷(AsF5)、氯化铁(FeCl3)和锂(Li)插层掺杂MLGNR互连在不同温度和不同互连长度下在16nm技术节点上的传输延迟。结果表明,随着温度的升高,MLGNR互连的延迟有较大的增加。研究发现,在较高的温度下,AsF5-、FeCl3-和li嵌入的顶触MLGNR互连比原始的MLGNR互连具有更好的电阻性能。在150K至450K的温度范围内,li插层TC-MLGNR是所有类型的MLGNR互连以及传统Cu互连中速度最快的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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