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Measurements and 3D Simulations of Full-Chip Potential Distribution at Parasitic Substrate Current Injection

30th European Solid-State Device Research Conference Pub Date : 2000-09-11 DOI:10.1109/ESSDERC.2000.194849
M. Schenkel, P. Pfaffli, S. Mettler, W. Reiner, W.D. Aemmer
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引用次数: 15
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30th European Solid-State Device Research Conference
30th European Solid-State Device Research Conference
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