T-BIST: A built-in self-test for analog circuits based on parameter translation

Abstract

In this paper we propose a technique for verifying whether or not the tested parameters are within the acceptance range. This technique called T-BIST is based on the conversion of each detected parameter to a DC voltage. The resulting DC voltage is proportional to the measured parameter and can be easily manipulated and tested. The test of the DC voltage value consists in comparing it to two reference voltages, V/sub refmin/ and V/sub refmax/, limiting the acceptance range of each parameter. The detection of the parameters and their conversion to a DC voltage is achieved by a detection and translation circuit incorporated in the circuit under test. An experimental study has been conducted to choose the translation relation of the parameters into DC voltages before designing the T-BIST structure. The sensitivity approach is used as the mathematical tool for this analysis.<>