Testing of an off-chip NoC protocol using a BIST/Synthesizable Testbench approach

Saif Uddin, Johnny Öberg
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引用次数: 2

Abstract

To make systems infinitely scalable is the holy grail of chip design and crux that needs to be solved in order to invent a sustainable design methodology. Network-on-Chip (NoC) has been suggested as this solution as it replaces the traditional buses for on-chip interconnection purposes. However, to reach infinite scalability, off-chip extensions to the NoC protocols are needed in order to maintain scalability at an affordable cost of manufacturability. Going off-chip introduces more levels of complexity when it comes to testing, not only should the chip testing be speedy, the off-chip connections must also be testable in a fast manner, the fastest way being a set of BISTs testing the whole structure in parallel. In this paper, we present a BIST approach for testing an off-chip NoC protocol used in a 4×4 Network-on-Chip configuration. It has 16 processor-nodes implemented on four interconnected plesiochronous Altera Stratix-II FPGA boards, each board hosting a Quad-core NoC.
使用BIST/可合成测试台方法测试片外NoC协议
使系统无限扩展是芯片设计的圣杯,也是为了发明一种可持续设计方法而需要解决的关键。片上网络(NoC)已被建议作为这种解决方案,因为它取代了用于片上互连目的的传统总线。然而,为了达到无限的可扩展性,需要对NoC协议进行片外扩展,以便在可制造性的可承受成本下保持可扩展性。当涉及到测试时,片外会引入更多的复杂性,不仅芯片测试要快速,片外连接也必须以快速的方式进行测试,最快的方式是一组bist并行测试整个结构。在本文中,我们提出了一种用于测试在4×4片上网络配置中使用的片外NoC协议的BIST方法。它有16个处理器节点,实现在四个互连的准同步Altera Stratix-II FPGA板上,每个板承载一个四核NoC。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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