W. Rieutort-Louis, Liechao Huang, Yingzhe Hu, J. Sanz-Robinson, T. Moy, Y. Afsar, J. Sturm, N. Verma, S. Wagner
{"title":"Current gain of amorphous silicon thin-film transistors above the cutoff frequency","authors":"W. Rieutort-Louis, Liechao Huang, Yingzhe Hu, J. Sanz-Robinson, T. Moy, Y. Afsar, J. Sturm, N. Verma, S. Wagner","doi":"10.1109/DRC.2014.6872403","DOIUrl":null,"url":null,"abstract":"In this paper we (1) show above-ft measurements for standard bottom-gate amorphous silicon (a-Si) TFTs and self-aligned bottom-gate a-Si TFTs and (2) illustrate how large TFT gate-drain capacitances lead to a slow current-gain roll-off at frequencies above ft.","PeriodicalId":293780,"journal":{"name":"72nd Device Research Conference","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"72nd Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2014.6872403","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
In this paper we (1) show above-ft measurements for standard bottom-gate amorphous silicon (a-Si) TFTs and self-aligned bottom-gate a-Si TFTs and (2) illustrate how large TFT gate-drain capacitances lead to a slow current-gain roll-off at frequencies above ft.