Reliability of 680-nm window laser diodes at 50-100 mW CW operation

A. Shima, H. Tada, T. Utakouji, T. Motoda, M. Tsugami, H. Higuchi, M. Aiga
{"title":"Reliability of 680-nm window laser diodes at 50-100 mW CW operation","authors":"A. Shima, H. Tada, T. Utakouji, T. Motoda, M. Tsugami, H. Higuchi, M. Aiga","doi":"10.1109/ISLC.1996.558766","DOIUrl":null,"url":null,"abstract":"By reduction of the operating current density due to a long cavity length of 900 /spl mu/m, reliable 5,000-hour operation of 680-nm window lasers has been realized under the conditions of 70 mW at 60/spl deg/C and 100 mW at 40/spl deg/C for the first time.","PeriodicalId":346992,"journal":{"name":"Conference Digest. 15th IEEE International Semiconductor Laser Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Digest. 15th IEEE International Semiconductor Laser Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISLC.1996.558766","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

By reduction of the operating current density due to a long cavity length of 900 /spl mu/m, reliable 5,000-hour operation of 680-nm window lasers has been realized under the conditions of 70 mW at 60/spl deg/C and 100 mW at 40/spl deg/C for the first time.
680nm窗口激光二极管在50- 100mw连续工作下的可靠性
由于腔长900 /spl mu/m,降低了工作电流密度,首次实现了在60/spl℃条件下70 mW和40/spl℃条件下100 mW的680 nm窗口激光器5000小时的可靠工作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信