CMOS-fabricated tensile Ge microstructures: towards an edge-emitting laser

G. Capellini, C. Reich, S. Guha, Y. Yamamoto, S. Lischke, J. Kreissl, L. Zimmermann, M. Virgilio, A. Ghrib, M. El Kurdi, P. Boucaud, B. Tillack, T. Schroeder
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引用次数: 1

Abstract

The realization of a Si-integrated light source represents today the "Holy Grail" of silicon photonics. An approach based on slightly tensile strained Ge/Si heterostructures has led to the demonstration of both optically and electrically pumped laser. This achievement has been welcomed by the scientific community as a leap toward a monolithically integrated silicon-based photonic platform. In this talk, a CMOS-based fabrication approach to obtain Ge microstripes on SOI substrates featuring uniaxial strain values up to -~1.5 % , resulting in an equivalent biaxial tensile strain value up to ε~9x10-3 is presented.
面向边缘发射激光器的cmos制备拉伸锗微结构
硅集成光源的实现代表了当今硅光子学的“圣杯”。一种基于微拉伸应变Ge/Si异质结构的方法已经导致了光和电泵浦激光器的演示。这一成就受到科学界的欢迎,被认为是迈向单片集成硅基光子平台的一次飞跃。在这次演讲中,提出了一种基于cmos的制造方法,可以在SOI衬底上获得单轴应变值高达- 1.5%的Ge微条纹,从而产生等效的双轴拉伸应变值高达ε~9x10-3。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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