A BiCMOS logic gate with positive feedback

Y. Nishio, F. Murabayashi, S. Kotoku, A. Watanabe, S. Shukuri, K. Shimohigashi
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引用次数: 34

Abstract

It is noted that, as BiCMOS process technology is refined, the supply voltage must be reduced due to the lower endurance voltage of the devices and the larger power dissipation of the LSI chips. As the MOS drain current decreases with supply voltage, the base current from the MOS in a BiCMOS logic gate should then be sufficient for high-speed switching. Also, as the threshold voltage of the MOS becomes lower, a full logic swing function is necessary, even for BiCMOS gates, to ensure that a DC current does not flow in the next gate. These problems were solved with a BiCMOS logic gate with positive feedback, which was fabricated using a 0.5- mu m BiCMOS device and applied to a channelless gate array for a high-speed processor. Characteristics of the proposed logic gates are summarized. Experimental t/sub pd/ and P/sub d/ versus C/sub L/ characteristics for the three-input NAND at 4-V supply voltage are shown.<>
具有正反馈的BiCMOS逻辑门
值得注意的是,随着BiCMOS工艺技术的完善,由于器件的耐久电压较低,LSI芯片的功耗较大,因此必须降低电源电压。当MOS漏极电流随电源电压减小时,BiCMOS逻辑门中MOS的基极电流应该足以实现高速开关。此外,随着MOS的阈值电压越来越低,即使对于BiCMOS栅极,也需要一个完整的逻辑摆幅功能,以确保直流电流不会流过下一个栅极。利用0.5 μ m的BiCMOS器件制作了具有正反馈的BiCMOS逻辑门,并将其应用于高速处理器的无通道门阵列中,从而解决了这些问题。总结了所提出的逻辑门的特点。给出了在4v电源电压下三输入NAND的实验t/sub pd/和P/sub d/与C/sub L/的特性
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