Combiner Networks for High Speed, High Density Integrated Circuit Susceptibility Testing

Abstract

Table 1. This paper describes various techniques which have been developed for combining high speed digital signals with RF signals for use in measuring the susceptibility characteristics of High Speed, High Density (HSHD) integrated circuits (IC's). Six different combiner networks are evaluated in terms of pin applicability, frequency range, bandwidth, RF-to-digital port isolation, and load sensitivity. This work was sponsored under RADC Contract F30602-85-C-0088.