New stable loadless 6T dual-port SRAM cell design

Antara Ganguly, Sangeeta Goyal, Sneha Bhatia, Anuj Grover
{"title":"New stable loadless 6T dual-port SRAM cell design","authors":"Antara Ganguly, Sangeeta Goyal, Sneha Bhatia, Anuj Grover","doi":"10.1109/ISVDAT.2016.8064859","DOIUrl":null,"url":null,"abstract":"Simultaneous read and write operations without any disturbance is a fundamental expectancy from any dual port static random access memory (DPSRAM) cell design. The paper proposes a stable loadless 6T DPSRAM cell design with reduced port setup time as compared to that of standard 8T DPSRAM along with better read stability. The design has lower cycle time allowing SRAM to operate at higher frequencies and hence, more memory can be accessed in a given time. To preserve the data integrity, an optimum port setup time is calculated using best fit curve from regression plots with 95% confidence bounds. As port setup time is increased, voltage value for spurious logic reduces. The proposed design has port setup time of 1.6 picoseconds as compared to 7.2 picoseconds of 8T DPSRAM.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 20th International Symposium on VLSI Design and Test (VDAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVDAT.2016.8064859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Simultaneous read and write operations without any disturbance is a fundamental expectancy from any dual port static random access memory (DPSRAM) cell design. The paper proposes a stable loadless 6T DPSRAM cell design with reduced port setup time as compared to that of standard 8T DPSRAM along with better read stability. The design has lower cycle time allowing SRAM to operate at higher frequencies and hence, more memory can be accessed in a given time. To preserve the data integrity, an optimum port setup time is calculated using best fit curve from regression plots with 95% confidence bounds. As port setup time is increased, voltage value for spurious logic reduces. The proposed design has port setup time of 1.6 picoseconds as compared to 7.2 picoseconds of 8T DPSRAM.
新的稳定的无负载6T双端口SRAM单元设计
无任何干扰的同时读写操作是任何双端口静态随机存取存储器(DPSRAM)单元设计的基本期望。本文提出了一种稳定的无负载6T DPSRAM单元设计,与标准8T DPSRAM相比,它减少了端口设置时间,并且具有更好的读取稳定性。该设计具有较低的周期时间,允许SRAM在更高的频率下工作,因此,在给定的时间内可以访问更多的内存。为了保持数据的完整性,使用具有95%置信限的回归图的最佳拟合曲线计算最佳端口设置时间。随着端口设置时间的增加,假逻辑的电压值降低。与8T DPSRAM的7.2皮秒相比,提出的设计具有1.6皮秒的端口设置时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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