K. Yasui, S. Hayakawa, Masato Nakamura, Daisuke Kawase, T. Ishigaki, K. Sasaki, Toshihito Tabata, T. Morita, M. Sagawa, H. Matsushima, Toshiyuki Kobayashi
{"title":"Improvement of power cycling reliability of 3.3kV full-SiC power modules with sintered copper technology for Tj, max=175°C","authors":"K. Yasui, S. Hayakawa, Masato Nakamura, Daisuke Kawase, T. Ishigaki, K. Sasaki, Toshihito Tabata, T. Morita, M. Sagawa, H. Matsushima, Toshiyuki Kobayashi","doi":"10.1109/ISPSD.2018.8393701","DOIUrl":null,"url":null,"abstract":"Higher maximum junction temperature operation requires higher power cycling reliability especially for silicon carbide power modules. In this work, with the help of a novel sintered copper die attach technology, 3.3kV/450A full-SiC power modules for up to 175°C maximum junction temperature were developed. Demonstrated power cycling lifetime shows an improvement of six times conventional Pb-rich solder die attach modules.","PeriodicalId":166809,"journal":{"name":"2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2018.8393701","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
Higher maximum junction temperature operation requires higher power cycling reliability especially for silicon carbide power modules. In this work, with the help of a novel sintered copper die attach technology, 3.3kV/450A full-SiC power modules for up to 175°C maximum junction temperature were developed. Demonstrated power cycling lifetime shows an improvement of six times conventional Pb-rich solder die attach modules.