Yun Wei, Sangmin Lee, P. Sundararajan, M. Dahlstrom, M. Urteaga, M. Rodwell
{"title":"High current (100 mA) InP/InGaAs/InP DHBTs with 330 GHz f/sub max/","authors":"Yun Wei, Sangmin Lee, P. Sundararajan, M. Dahlstrom, M. Urteaga, M. Rodwell","doi":"10.1109/ICIPRM.2002.1014097","DOIUrl":null,"url":null,"abstract":"We report high f/sub max/ and high current InP/InGaAs/InP DHBT in transferred-substrate technology. The common base device with equivalent emitter size of 128 /spl mu/m/sup 2/ exhibits f/sub max/ of 330 GHz at a current of 100 mA. The common emitter device with emitter area of 64 /spl mu/m/sup 2/ shows f/sub max/ of 371 GHz when biased at 57 mA. The breakdown voltage of these DHBTs is up to 7 V at low current density. All the devices are realized in multi-finger structure that was deliberately designed to improve the thermal stability at high power operation and to reduce the parasitics. To our knowledge, this is the highest f/sub max/ for a DHBT biased at such high current.","PeriodicalId":145425,"journal":{"name":"Conference Proceedings. 14th Indium Phosphide and Related Materials Conference (Cat. No.02CH37307)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. 14th Indium Phosphide and Related Materials Conference (Cat. No.02CH37307)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.2002.1014097","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
We report high f/sub max/ and high current InP/InGaAs/InP DHBT in transferred-substrate technology. The common base device with equivalent emitter size of 128 /spl mu/m/sup 2/ exhibits f/sub max/ of 330 GHz at a current of 100 mA. The common emitter device with emitter area of 64 /spl mu/m/sup 2/ shows f/sub max/ of 371 GHz when biased at 57 mA. The breakdown voltage of these DHBTs is up to 7 V at low current density. All the devices are realized in multi-finger structure that was deliberately designed to improve the thermal stability at high power operation and to reduce the parasitics. To our knowledge, this is the highest f/sub max/ for a DHBT biased at such high current.