{"title":"Innovative practices session 7C automotive quality assurance","authors":"Peter Sarson","doi":"10.1109/VTS.2017.7928949","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":123648,"journal":{"name":"IEEE VLSI Test Symposium","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2017.7928949","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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