Controllable electrical breakdown of multiwall carbon nanotubes

Bo Song, N. Xi, Zhiyong Sun, Ruiguo Yang, Liangliang Chen, Hongzhi Chen
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引用次数: 2

Abstract

Controllable electrical breakdown of multiwall nanotubes (MWNTs) is studied utilizing the atomic force microscopy (AFM). Electrical breakdown has been known as the way to fundamentally understand the electrical properties of nanotubes and an approach to develop MWNT based transistors and sensors. Normally, electrical breakdown was known to be happened in the center of MWNT because of the thermal accumulation. However, considering the effect of thermal dissipation, the electrical breakdown could be mechanically controlled by an additional heat sink, which could be the substrate of MWNT device. Therefore, the electrical breakdown process is controllable through controlling Joule heating and thermal dissipation. In this research, we study the crucial factors that affect the electrical breakdown. The AFM based nano robot is used to measure the conductance distribution, and manipulate the three dimensional structure of MWNT in order to change the position of heat sink to control the location where electrical breakdown happened. The controllable electrical breakdown is an alternative approach for conducting bandgap engineering in nanodevice and fabricating high performance nano sensors and transistors.
多壁碳纳米管的可控电击穿
利用原子力显微镜(AFM)研究了多壁纳米管的可控电击穿。电击穿被认为是从根本上理解纳米管电学特性的方法,也是开发基于纳米管的晶体管和传感器的方法。通常情况下,由于热积累,电击穿发生在MWNT的中心。然而,考虑到散热的影响,电击穿可以通过一个额外的散热片来机械控制,该散热片可以作为MWNT器件的衬底。因此,通过控制焦耳加热和散热,可以控制电击穿过程。在本研究中,我们研究了影响电击穿的关键因素。利用基于AFM的纳米机器人测量MWNT的电导分布,操纵MWNT的三维结构来改变散热片的位置,从而控制发生电击穿的位置。可控电击穿是进行纳米器件带隙工程和制造高性能纳米传感器和晶体管的另一种方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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