Analyzing Transient Faults and Functional Error Rates of a RISC-V Core: A Case Study

Dun-An Yang, J. Liou, Harry H. Chen
{"title":"Analyzing Transient Faults and Functional Error Rates of a RISC-V Core: A Case Study","authors":"Dun-An Yang, J. Liou, Harry H. Chen","doi":"10.1109/ATS52891.2021.00035","DOIUrl":null,"url":null,"abstract":"It is essential to perform extensive RTL functional fault simulation for critical systems in order to analyze the vulnerability and design error-tolerant measures accordingly. Since the number of faults would be exceedingly large for a full simulation, fault sampling techniques are applied. However, little information are available for fault characteristics, so the sampling might not be effective: often producing no error output or similar output syndromes.In this paper, we utilized an advanced Architecturally Correct Execution (ACE) analysis to study the functional fault characteristics of registers on a RISC-V core. From the results for all registers, only less than 0.34% to 2.76% of total faults need to be simulated. We then further sample and simulate these remained faults at RTL to analyze the categories for failure output syndromes. We found that faults at non-architecture registers have much higher masked results (as high as 90%), as compared with architecture registers (16% – 40%). Therefore, it is suggested that fault sampling should consider register and fault characteristics for a more effective result.","PeriodicalId":432330,"journal":{"name":"2021 IEEE 30th Asian Test Symposium (ATS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 30th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS52891.2021.00035","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

It is essential to perform extensive RTL functional fault simulation for critical systems in order to analyze the vulnerability and design error-tolerant measures accordingly. Since the number of faults would be exceedingly large for a full simulation, fault sampling techniques are applied. However, little information are available for fault characteristics, so the sampling might not be effective: often producing no error output or similar output syndromes.In this paper, we utilized an advanced Architecturally Correct Execution (ACE) analysis to study the functional fault characteristics of registers on a RISC-V core. From the results for all registers, only less than 0.34% to 2.76% of total faults need to be simulated. We then further sample and simulate these remained faults at RTL to analyze the categories for failure output syndromes. We found that faults at non-architecture registers have much higher masked results (as high as 90%), as compared with architecture registers (16% – 40%). Therefore, it is suggested that fault sampling should consider register and fault characteristics for a more effective result.
RISC-V内核瞬态故障与功能错误率分析
为了分析关键系统的脆弱性并设计相应的容错措施,有必要对关键系统进行广泛的RTL功能故障仿真。由于故障的数量对于一个完整的模拟来说是非常大的,所以采用了故障采样技术。然而,关于故障特征的信息很少,因此采样可能不有效:通常不会产生错误输出或类似的输出综合征。在本文中,我们利用先进的架构正确执行(ACE)分析来研究RISC-V内核上寄存器的功能故障特征。从所有寄存器的结果来看,只有不到0.34%到2.76%的总故障需要模拟。然后,我们在RTL中进一步采样和模拟这些剩余的故障,以分析故障输出综合征的类别。我们发现,与体系结构寄存器(16% - 40%)相比,非体系结构寄存器的故障具有更高的掩蔽结果(高达90%)。因此,建议在故障采样中考虑配准和故障特征,以获得更有效的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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