Improved 1 kHz capacitance calibration uncertainty

IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI:10.1109/IMTC.2002.1006818

A. Jeffery, A. Koffman

引用次数: 1

Abstract

Uncertainties for 1 kHz capacitance calibrations have been decreased at the National Institute of Standards and Technology (NIST). The improvements are based on frequency-dependence characterization from 1592 Hz to 1 kHz. The relevant measurements and the traceability procedures from the calculable capacitor to the customer calibration are described.

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改进1khz电容校准不确定度

美国国家标准与技术研究所(NIST)降低了1khz电容校准的不确定度。这些改进是基于1592 Hz到1 kHz的频率相关特性。描述了从可计算电容器到客户校准的相关测量和可追溯程序。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)

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