Gate turn-off thyristor on the basis of the SDB-technique

I. Grekhov, L. S. Kostina, E.I. Belakova, I.A. Rolnik
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Abstract

Silicon Direct Bonding (SDB) technique has been used for designing GTO with a double-layer p-base in which a net of highly doped stripes was made at the interface between the two p-type layers. The device provides a-higher (by an order of magnitude or more) emitter blocking voltage and a lower (nearly 5 times) p-base tangential resistance than in the conventional GTO. This allows one to control a large operating area, to simplify the technology and improve the heat removal. The device has good static and dynamic characteristics with abrupt main current and control current breakage during the turn-off process in contrast to the conventional GTO.
基于sdb技术的门关断晶闸管
采用硅直接键合(SDB)技术设计了双层p基的GTO,在两层p基之间的界面处形成了高掺杂条纹网。该器件提供比传统GTO更高(一个数量级或更多)的发射极阻断电压和更低(近5倍)的p基切向电阻。这使得人们可以控制更大的操作区域,简化技术并改善散热。与传统的GTO相比,该器件具有良好的静态和动态特性,在关断过程中主电流突变和控制电流中断。
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