{"title":"Tne study of deterioration wchanigm and stability tecnnique of surface sustained voltage of flower electronic devices","authors":"Xu Chuan-xiang, Zhang Shaoyun, Feng Yuzhu, Liu Di","doi":"10.1109/ISPSD.1990.991087","DOIUrl":null,"url":null,"abstract":"MStract-It is described that the ions migration in protecting materials Changes the charge distribution and the surface depletion region width (W,) of device, S o that the distribution of electric field deteriorate. It is a useful method for stabilizing the electric field using semiinsulating amorphous Si film as the inlaye1' protection and high-purity, highresistivity insulating organic materials on the surface coation of devices.","PeriodicalId":162198,"journal":{"name":"Proceedings of the 2nd International Symposium on Power Semiconductor Devices and Ics. ISPSD '90.","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2nd International Symposium on Power Semiconductor Devices and Ics. ISPSD '90.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1990.991087","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
MStract-It is described that the ions migration in protecting materials Changes the charge distribution and the surface depletion region width (W,) of device, S o that the distribution of electric field deteriorate. It is a useful method for stabilizing the electric field using semiinsulating amorphous Si film as the inlaye1' protection and high-purity, highresistivity insulating organic materials on the surface coation of devices.