Rectification of near-field images

Proceedings of 2002 4th International Conference on Transparent Optical Networks (IEEE Cat. No.02EX551) Pub Date : 2002-08-07 DOI:10.1109/ICTON.2002.1009543

K. Gaikovich, V.F. Dryakhlushin, Y. Nozdrin, A. N. Reznik, V. Vaks, A. Zhilin

引用次数: 2

Abstract

Significant enhancement of resolution in the scanning near-field optical microscopy (SNOM) and in microwave subsurface imaging is achieved by deconvolution of measured 2-D distributions using Tikhonov's method. This method makes it possible to obtain much better sharpness of images.

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近场图像的校正

扫描近场光学显微镜(SNOM)和微波地下成像的分辨率显著提高是通过使用Tikhonov方法对测量的二维分布进行反卷积实现的。这种方法可以获得更好的图像清晰度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings of 2002 4th International Conference on Transparent Optical Networks (IEEE Cat. No.02EX551)

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