Analog-to-Digital Converter Dynamic Testing by Linearized Four-Parameter Sine-Fit Algorithm

Abstract

In this paper a linearized version of the four-parameter sine-fit algorithm suggested in the IEEE Standard 1241 for the dynamic testing of analog-to-digital converters is proposed. Algorithm linearization is performed through the Gauss-Newton method and the related closed form expressions are provided. The accuracies of the proposed and the classical versions of the four-parameter sine-fit algorithm are compared each other by means of both computer simulations and experimental results.