32Kb Innovative fuse (I-Fuse) array in 22nm FD-SOI with 0.9V/1.4mA program voltage/current and 0.744um2 cell

Shine C. Chung, Wen-Kuan Fang, Jay Lin, Wen-Hua Yu, J. Hsiao
{"title":"32Kb Innovative fuse (I-Fuse) array in 22nm FD-SOI with 0.9V/1.4mA program voltage/current and 0.744um2 cell","authors":"Shine C. Chung, Wen-Kuan Fang, Jay Lin, Wen-Hua Yu, J. Hsiao","doi":"10.1109/S3S.2017.8308735","DOIUrl":null,"url":null,"abstract":"I-fuse is a revolutionary OTP programmed below an on-set of thermal runaway and above electromigration (EM) threshold. On 22nm FD-SOI, the 1R1T I-fuse has a 0.744um2 cell and 0.0312mm2 32Kb array with program voltage ranging from 0.9 V to 1.4 V. The whole array does not require high voltage circuits or charge pumps. The cell current distributions for data 0 and 1 are very tight and have large separation in between that can be sensed easily. The first cut design has been qualified at 150oC for 1,000 hours with very small cell current variations.","PeriodicalId":333587,"journal":{"name":"2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/S3S.2017.8308735","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

I-fuse is a revolutionary OTP programmed below an on-set of thermal runaway and above electromigration (EM) threshold. On 22nm FD-SOI, the 1R1T I-fuse has a 0.744um2 cell and 0.0312mm2 32Kb array with program voltage ranging from 0.9 V to 1.4 V. The whole array does not require high voltage circuits or charge pumps. The cell current distributions for data 0 and 1 are very tight and have large separation in between that can be sensed easily. The first cut design has been qualified at 150oC for 1,000 hours with very small cell current variations.
创新的保险丝(I-Fuse)阵列,采用22nm FD-SOI,程序电压/电流为0.9V/1.4mA,电池面积为0.444 um2
I-fuse是一种革命性的OTP,其编程低于热失控设定,高于电迁移(EM)阈值。在22nm FD-SOI上,1R1T i -保险丝具有0.744 mm2单元和0.0312mm2 32Kb阵列,程序电压范围为0.9 V至1.4 V。整个阵列不需要高压电路或充电泵。数据0和1的单元电流分布非常紧密,并且之间有很大的间隔,可以很容易地检测到。第一个切割设计已经在150℃下测试了1000小时,电池电流变化非常小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信