{"title":"The total dose response of NPN transistors with different package types to various irradiation conditions","authors":"S. Dowling","doi":"10.1109/REDW.1996.574187","DOIUrl":null,"url":null,"abstract":"Devices with two different geometries were made from single wafers, in four different packages. The effects of temperature, shielding and dose rate during irradiation were also studied, for total doses of 25 to 200 Gy.","PeriodicalId":196196,"journal":{"name":"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.1996.574187","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Devices with two different geometries were made from single wafers, in four different packages. The effects of temperature, shielding and dose rate during irradiation were also studied, for total doses of 25 to 200 Gy.