Design rule development for microwave flip chip applications

D. Staiculescu, J. Laskar, J. Mather
{"title":"Design rule development for microwave flip chip applications","authors":"D. Staiculescu, J. Laskar, J. Mather","doi":"10.1109/EPEP.1999.819232","DOIUrl":null,"url":null,"abstract":"This paper presents a novel approach for analysis of factors to be considered when designing a flip chip package. It includes the design of an experiment and statistical analysis of the outputs. The most significant factors are found to be, from most to least important, the length of the area where the device and the substrate overlap (referred to as conductor overlap), the bump diameter and the width of the coplanar waveguide transmission line launch. These results are valid for conductor overlaps between 300 and 500 /spl mu/m. For a lower overlap value (120 /spl mu/m), the bump height also becomes significant. The substrate thickness in the 10 to 25 mil interval is found to be statistically insignificant, and therefore can be eliminated from further analysis.","PeriodicalId":299335,"journal":{"name":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","volume":"225 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1999.819232","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18

Abstract

This paper presents a novel approach for analysis of factors to be considered when designing a flip chip package. It includes the design of an experiment and statistical analysis of the outputs. The most significant factors are found to be, from most to least important, the length of the area where the device and the substrate overlap (referred to as conductor overlap), the bump diameter and the width of the coplanar waveguide transmission line launch. These results are valid for conductor overlaps between 300 and 500 /spl mu/m. For a lower overlap value (120 /spl mu/m), the bump height also becomes significant. The substrate thickness in the 10 to 25 mil interval is found to be statistically insignificant, and therefore can be eliminated from further analysis.
微波倒装芯片应用的设计规则开发
本文提出了一种新的方法来分析设计倒装芯片封装时要考虑的因素。它包括实验设计和输出的统计分析。发现最重要的因素是,从最重要到最不重要的是,器件和衬底重叠区域的长度(称为导体重叠),凹凸直径和共面波导传输线发射的宽度。这些结果适用于300和500 /spl mu/m之间的导体重叠。对于较低的重叠值(120 /spl mu/m),凸起高度也变得显著。在10到25mil区间的衬底厚度在统计上是不显著的,因此可以从进一步的分析中消除。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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