High-Density Solid-State Storage: A Long Path to Success

A. Lacaita, A. Spinelli, C. M. Compagnoni
{"title":"High-Density Solid-State Storage: A Long Path to Success","authors":"A. Lacaita, A. Spinelli, C. M. Compagnoni","doi":"10.1109/LAEDC51812.2021.9437865","DOIUrl":null,"url":null,"abstract":"This paper covers the recent evolution of high-density solid-state storage, which is the most prominent storage solution of the 21st century. The attention is focused on the two integrated technologies that more than any other are revolutionizing the storage landscape: the NAND Flash technology and the Phase-Change Memory (PCM) technology. The success of the NAND Flash technology has been the outcome of its strenuous attempt not only to maximize the bit storage density achievable with a cost-effective process over the surface of a silicon die, but also to increase that density at a regular pace thanks to favorable evolutionary approaches. In this way, NAND Flash memories have become the elective storage media for a wide variety of electronic applications, overwhelming hard-disk drives. The PCM technology represents, instead, a notable exploitation of a new memory concept to provide a novel trade-off among cost, performance and reliability. In particular, the PCM attempt to address performance more than cost needs is driving a shift in the traditional storage hierarchy, with storage-class memory finally becoming a reality.","PeriodicalId":112590,"journal":{"name":"2021 IEEE Latin America Electron Devices Conference (LAEDC)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Latin America Electron Devices Conference (LAEDC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LAEDC51812.2021.9437865","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

This paper covers the recent evolution of high-density solid-state storage, which is the most prominent storage solution of the 21st century. The attention is focused on the two integrated technologies that more than any other are revolutionizing the storage landscape: the NAND Flash technology and the Phase-Change Memory (PCM) technology. The success of the NAND Flash technology has been the outcome of its strenuous attempt not only to maximize the bit storage density achievable with a cost-effective process over the surface of a silicon die, but also to increase that density at a regular pace thanks to favorable evolutionary approaches. In this way, NAND Flash memories have become the elective storage media for a wide variety of electronic applications, overwhelming hard-disk drives. The PCM technology represents, instead, a notable exploitation of a new memory concept to provide a novel trade-off among cost, performance and reliability. In particular, the PCM attempt to address performance more than cost needs is driving a shift in the traditional storage hierarchy, with storage-class memory finally becoming a reality.
高密度固态存储:通往成功的漫漫长路
本文介绍了高密度固态存储的最新发展,高密度固态存储是21世纪最突出的存储解决方案。人们的注意力集中在两种集成技术上,它们比任何其他技术都更能彻底改变存储领域:NAND闪存技术和相变存储器(PCM)技术。NAND闪存技术的成功不仅得益于其在硅晶片表面上以经济高效的工艺实现最大比特存储密度的努力,而且得益于有利的进化方法,以定期的速度增加该密度。通过这种方式,NAND闪存已成为各种电子应用的首选存储介质,压倒了硬盘驱动器。相反,PCM技术代表了一种值得注意的新存储器概念的开发,它在成本、性能和可靠性之间提供了一种新的权衡。特别是,PCM试图解决性能而不是成本需求,这推动了传统存储层次结构的转变,存储级内存最终成为现实。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信