{"title":"Subthreshold minority-3 gates and inverters used for 32-bit serial and parallel adders implemented in 90 nm CMOS","authors":"S. Aunet","doi":"10.1109/NORCHP.2009.5397845","DOIUrl":null,"url":null,"abstract":"32-bit serial and parallel adders exploiting minority-3 elements and inverters only, are presented, including chip measurements. The implementation is done in a standard triple-well 90 nm CMOS process. Measurements also demonstrate that the digital abstraction may be maintained for basic building blocks under the presence of stuck-open faults and defect transistors, for a redundancy factor, R, of only 2. R = 2 combined with shorted driven nodes is lower than the traditional R=3 in combination with majority voting.","PeriodicalId":308859,"journal":{"name":"2009 NORCHIP","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 NORCHIP","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NORCHP.2009.5397845","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
32-bit serial and parallel adders exploiting minority-3 elements and inverters only, are presented, including chip measurements. The implementation is done in a standard triple-well 90 nm CMOS process. Measurements also demonstrate that the digital abstraction may be maintained for basic building blocks under the presence of stuck-open faults and defect transistors, for a redundancy factor, R, of only 2. R = 2 combined with shorted driven nodes is lower than the traditional R=3 in combination with majority voting.