Implementation of Checkers for DFT Gaskets using SV/UVM

Pujashree, Latha H.K.E, Dayananda Ys
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Abstract

DFT (Design for Testability) is an important additional logic that is inserted in an ASIC across the functional logic to aid post-production testing of the chip and to evaluate the faults in silicon that could have caused due to imperfections in fabrication process. DFT gasket verification is required because DFT is again implemented by Engineers which is prone to human errors. In today's ever-growing complexity of Systems-on-Chip (SoC)s, insufficient or inefficient DFT support due to poor specification, implementation or lax design procedures can suddenly become essential to meet market deadlines and delivering products under budget and tight schedules. The goal of this project is to provide a comprehensive, systematic, and completely automated approach for verification of DFT gaskets. The gaskets have to work predictably being cycle-accurate and in sequence as per expectation. Any deviation from the specification could have serious consequences including chip failure, subsequently causing billions of $ cost. An adoptable, random, predictable, cycle-accurate and robust infrastructure had to be built to verify the DFT gaskets so as to ensure the design is bug free. To be reusable, we have chosen UVM as methodology for environment and SystemVerilog as language for verification. Developing the scenarios in testcases and subsequently checkers for the same was carried out. Here DFT gaskets are On-chip clock controller and SRAM. Working of checkers is to compare the actual data expected data. Exceed application was used for connecting to server, Synopsys VCS was used for simulation and Synopsys Verdi tool for debugging.
使用SV/UVM实现DFT垫圈检查器
DFT (Design for Testability,可测试性设计)是一个重要的附加逻辑,它跨功能逻辑插入ASIC中,以帮助芯片的后期测试,并评估由于制造过程中的缺陷可能导致的硅中的故障。DFT垫片验证是必需的,因为DFT再次由工程师实施,容易出现人为错误。在当今日益复杂的片上系统(SoC)中,由于规范不佳、实施或设计程序松懈而导致的DFT支持不足或效率低下,对于满足市场最后期限和在预算和紧迫的时间表下交付产品来说,可能突然变得至关重要。该项目的目标是提供一种全面、系统和完全自动化的方法来验证DFT垫片。垫片必须工作可预测的周期准确,并按顺序预期。任何与规格的偏差都可能导致严重的后果,包括芯片故障,随后造成数十亿美元的损失。必须建立一个可采用的、随机的、可预测的、周期精确的和健壮的基础设施来验证DFT垫圈,以确保设计没有错误。为了便于重用,我们选择了UVM作为环境方法,SystemVerilog作为验证语言。在测试用例中开发场景,并随后对其进行检查。这里的DFT垫圈是片上时钟控制器和SRAM。检查人员的工作是比较实际数据和预期数据。使用Exceed应用程序连接服务器,使用Synopsys VCS进行仿真,使用Synopsys Verdi工具进行调试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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