{"title":"The influence of a phase change in the measured voltage on flickermeter response","authors":"M. Rogóż, A. Bień, Z. Hanzelka","doi":"10.1109/ICHQP.2004.1409377","DOIUrl":null,"url":null,"abstract":"The influence of a phase change in the measured voltage on a flickermeter response is discussed. The paper shows that the instant of occurrence of a phase change can influence the flickermeter response if the disturbance occurs just before the termination of the ten-minute Pst evaluation interval.","PeriodicalId":406398,"journal":{"name":"2004 11th International Conference on Harmonics and Quality of Power (IEEE Cat. No.04EX951)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 11th International Conference on Harmonics and Quality of Power (IEEE Cat. No.04EX951)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICHQP.2004.1409377","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
The influence of a phase change in the measured voltage on a flickermeter response is discussed. The paper shows that the instant of occurrence of a phase change can influence the flickermeter response if the disturbance occurs just before the termination of the ten-minute Pst evaluation interval.