High frequency characteristics of MOSFETs with compact waffle layout

Abstract

The high frequency characteristics of waffle MOSFETs are studied. In addition to area saving, the waffle MOSFETs also provide enhancement of the RF characteristics. When compared with the conventional multi-finger layout with the same device width, the waffle MOSFETs provide extra flexibility in the design window. Measured S-parameters from a 0.35 /spl mu/m technology process, over a wide range of bias conditions, indicate that the waffle MOSFET is capable of offering enhancements in f/sub max/, f/sub T/, and minimum noise figure, with careful design.