T. Vergine, M. De Matteis, L. Rota, A. Marchioro, A. Baschirotto
{"title":"An automatic calibration circuit for 12-bits single-ramp A-to-D converter in LHC environments","authors":"T. Vergine, M. De Matteis, L. Rota, A. Marchioro, A. Baschirotto","doi":"10.1109/PRIME.2013.6603108","DOIUrl":null,"url":null,"abstract":"A calibration circuit for single-ramp A-to-D converters is presented here. The calibration circuit allows to automatically compensate the process/mismatch and radiation effects on the A-to-D converter, improving performance and Equivalent Number of Bits. In particular, the calibration circuit is able to automatically align the ramp signal reference used for the conversion in single slope architectures A-to-D architectures, compensating slope deviations due to technological/electrical reasons. Moreover, the calibration circuit shares the same analog circuits of the A-to-D converter, requiring only a small additional power budget and logic for the implementation. The calibration circuit has been validated, testing the overall A-to-D converter after the calibration. A 12 steps binary search is required to calibrate the A-to-D converter (about 2.5ms). This calibration circuit is able to guarantee an 11bits accuracy, in the worst case simulation corner. The technology used is a 65 nm CMOS. The clock frequency has been set to 20 MHz and the power consumption is about 400 μW.","PeriodicalId":125553,"journal":{"name":"Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)","volume":"108 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PRIME.2013.6603108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
A calibration circuit for single-ramp A-to-D converters is presented here. The calibration circuit allows to automatically compensate the process/mismatch and radiation effects on the A-to-D converter, improving performance and Equivalent Number of Bits. In particular, the calibration circuit is able to automatically align the ramp signal reference used for the conversion in single slope architectures A-to-D architectures, compensating slope deviations due to technological/electrical reasons. Moreover, the calibration circuit shares the same analog circuits of the A-to-D converter, requiring only a small additional power budget and logic for the implementation. The calibration circuit has been validated, testing the overall A-to-D converter after the calibration. A 12 steps binary search is required to calibrate the A-to-D converter (about 2.5ms). This calibration circuit is able to guarantee an 11bits accuracy, in the worst case simulation corner. The technology used is a 65 nm CMOS. The clock frequency has been set to 20 MHz and the power consumption is about 400 μW.